Presentation Information
[OPTMp-01][Withdraw] Microscopic Defect Detection of Thin Films Based on Deep Learning and Knowledge Distillation Method
*Chuen-Lin Tien1, Hsiang-Hsun H. Tsai2, Hsi-Fu Shih2 (1. Feng Chia University, 2. National Chung Hsing University)
Password required to view
If you are a convention participant, please log in using the login button.
Log in
or
Comment
To browse or post comments, you must log in.Log in