Presentation Information
[XOPT2-03]Metrology and manufacture of X-ray reflective optics with nanometer accuracy
*Qiushi Huang1, Zhanshan Wang1, Pengfeng Sheng1 (1. Tongji University)
Password required to view
If you are a convention participant, please log in using the login button.
Log in
or
Comment
To browse or post comments, you must log in.Log in