Imaging (I)

9:45 AM - 10:00 AM JST(12:45 AM - 1:00 AM UTC)

[XOPT4-03] Development of Tender X-ray Spectroscopic Ptychography Measurement System Using Advanced Kirkpatrick-Baez Mirrors

*Yuhei Sasaki^1,2,3, Nozomu Ishiguro^1,3, Masaki Abe^1,3, Hideshi Uematsu^1,2,3, Shuntaro Takazawa^1,2,3, Naru Okawa^1,2,3, Fusae Kaneko^4,5, Yukio Takahashi^1,3,5,6 (1. International Center for Synchrotron Radiation Innovation Smart (SRIS), 2. Department of Metallurgy, Graduate School of Engineering, Tohoku University, 3. RIKEN SPring-8 Center, 4. Sumitomo Rubber Industries, Ltd., 5. Institute of Multidisciplinary Research for Advanced Materials (IMRAM), 6. Institute for Materials Research (IMR))