Presentation Information
[XOPT9-04]Bragg reflection X-ray polarimeter based on a bent silicon crystal using hot plastic deformation
*Daiki Ishi1, Aoi Ishimure2, Yuichiro Ezoe2, Kumi Ishikawa2, Masaki Numazawa2, Hiromi Morishita2, Rei Ishikawa2, Daiki Morimoto2, Yudai Yamada2, Shunei Miyauchi2, Yuto Ogasawara2, Naoya Sera2, Haruka Nakagawa2, Yu Fukushima2, Kazuhisa Mitsuda3, Kohei Morishita4, Kazuo Nakajima5 (1. Institute of Space and Astronautical Science, Japan Aerospace Exploration Agency, 2. Department of Physics, Tokyo Metropolitan University, 3. International Center for Quantum-field Measurement Systems for Studies of the Universe and Particles, Inter-University Research Institute Corporation High Energy Accelerator Research Organization, 4. Faculty of Engineering, Kyushu University, 5. Institute for Materials Research, Tohoku University)