OPTICS & PHOTONICS International Congress 2025
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Mon. Apr 21, 2025
Tue. Apr 22, 2025
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[XOPTp-41]
X-ray Angular Metrology Based on Crystal Dynamical Diffraction
*Fugui Yang
1
, Chaoqun SUN
1
, Weifan SHENG
1
, Ming LI
1
, Xiaowei ZHANG
1
(1. Institute of High Energy Physics)
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