Presentation Information

[ALPS-I3-01(Invited)]Advances in Frequency Metrology with Optical Frequency Combs

*Michele Giunta1,2, Frederik Böhle1, Wolfgang Haensel1, Matthias Lezius1, Marc Fischer1, Ronald Holzwarth1,2 (1. Menlo Systems GmbH, 2. Max-Planck-Institut für Quantenoptik)

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