Presentation Information
[ALPSp1-05]Closed-aperture Z-scan Measurement on the NonlinearRefractive Index of PVD-grown CoTe2 Thin Film
*Donguk Lee1, Janghyun Ryu1, Yeong Gwang Kim1, Suh-young Kwon1, Jaehak Choi1, Taeho Woo1, Jeehwan Kim1, Young Jun Chang1, Ju Han Lee1 (1. University of Seoul)
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