HEDLA/HEDS Poster Session

[HEDLA_HEDSp-22] Measurement of Secondary Fragments in Stack Detectors using Machine Learning

*Hayato Kusano¹, Fuka Nikaido¹, Naoya Tamaki¹, Naoya Hayashi¹, Yuki Abe^1,2, Yuji Fukuda³, Masato kanasaki⁴, Satoshi Kodaira⁵, Yasuhiro Kuramitsu^1,2,3 (1. Graduate School of Engineering, Osaka University, 2. Institute of Laser Engineering (ILE), Osaka University, 3. QST-KPSI, 4. Kobe University, 5. QST-NIRS)