Presentation Information
[XOPTp-09]Development of figure correction process based on thickness of Si for large Wolter mirror
*Shutaro Mohri1, Hiroto Motoyama1, Kento Ogasawara1, Satoru Egawa1, Gota Yamaguchi2, Jianli Guo1, Takuya Hosobata1, Hidekazu Mimura1,2 (1. The University of Tokyo, 2. RIKEN, SPring-8)
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