Presentation Information
[XOPTp-20]Extreme profile correction and resolution for sub-200 pm RMS height error UHV adaptive X-ray optics
*Elliot Jane1, Simon G Alcock3, Murilo Bazan da Silva3, Luis Mateos1, Hiroki Nakamori2 (1. XDS Oxford, 2. JTEC Corporation, 3. Diamond Light Source Ltd, Metrology Group)
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