Session Details

Interferometry

Tue. Apr 21, 2026 1:15 PM - 2:30 PM JST
Tue. Apr 21, 2026 4:15 AM - 5:30 AM UTC
213 (Pacifico Yokohama Conference Center)
Session Chair: Chulmin Joo, Eriko Watanabe

[OPTM5-01(Invited)]Thickness and Surface Profile Measurement using Spectral Interferometry

*Jonghan Jin1, Heulbi Ahn1 (1. Meter-Lab. Inc.)
Comment()

[OPTM5-02]Phase shifting Interferometry and Wavefront Compensation using Liquid Crystal on Silicon (LCOS) Spatial Light Modulator (SLM)

*INDRANI BHATTACHARYA1,2, Marcus Petz2, Rainer Tutsch2 (1. University of Calcutta, 2. TU Braunschweig, Lower Saxony, Germany)
Comment()

[OPTM5-03]Division balanced detection in optical heterodyne
interferometry for high repeatability at non-zero phase

*Naoaki Kato1, Kazuhiro Nakamura1, Yu Takiguchi1 (1. Hamamatsu Photonics K.K.)
Comment()

[OPTM5-04]Development of a Coplanar Detection Type Grating Interferometer for Measurements of Displacement and Angular Displacement.

*Tsung-Hua Tsai1, Hung-Lin Hsieh1, Kun-Huai Shen1 (1. National Taiwan University of Science and Technology)
Comment()