Presentation Information

[4-1-03]DC reliability of superlattice PZT thin films

*Madeleine Petschnigg Petschnigg1,2, Ryunosuke Yagi3, Naoki Yamamoto3, Isaku Kanno3, Marco Deluca1, Susan Trolier-McKinstry2 (1. Silicon Austria Labs , 2. Pennsylvania State Univ., 3. Kobe Univ.)

Comment

To browse or post comments, you must log in.Log in