Presentation Information
[4-03]Below 10A CMOS- Double CFETs with Dielectric-wall-stress by Isolation-last Process for 0.0069 um2 of SRAM-cell Design
*Yi-Sung Chen2, Yu-Shang Shih2, Hao-Ming Huang2, Ting-Kuan Ma2, E Ray Hsieh1 (1. National Yang Ming Chiao Tung University (Taiwan), 2. National Central University (Taiwan))
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