Presentation Information

[A-10-05]The anomaly decection method for industrial parts on Few-shot data by Deep Metric Learning

◎Kotaro Nabeshima1, Shozo Saeki2, Takashi Sasaki2, Minoru Kawahara2, Hirohisa Aman2 (1. Graduate School of Science and Engineering, Ehime Univ., 2. Center for Information Technology, Ehime Univ.)

Keywords:

Anomaly Detection,Few-shot Learning,Metric Learning