[A-10] システム数理と応用

10:30 AM - 10:45 AM JST(1:30 AM - 1:45 AM UTC)Candidate for Academic Incentive Award

[A-10-05] The anomaly decection method for industrial parts on Few-shot data by Deep Metric Learning

◎Kotaro Nabeshima¹, Shozo Saeki², Takashi Sasaki², Minoru Kawahara², Hirohisa Aman² (1. Graduate School of Science and Engineering, Ehime Univ., 2. Center for Information Technology, Ehime Univ.)

Keywords:

Anomaly Detection,Few-shot Learning,Metric Learning