Presentation Information
[C-3_C-4-02]Impact of 3-dB Bandwidth of a Testing Station on Signal Integrity of 400-Gb/s VCSEL Transceivers
◎Kensho Nishizaki1, Kazuya Nagashima1, Wataru Yoshida1, Hideyuki Nasu1 (1. Furukawaelectric)
Keywords:
Co-Packaged Optics,VCSEL Transceiver,400Gb/s,Testing Station