Presentation Information

[B-10A_B-13-25]High-resolution reflectivity profiling over 45 km via periodic pseudo-randomly modulated OCDR

〇Takaki Kiyozumi1,2, Yuta Higa1, Keisuke Motoda1, Takahiro Ishimaru3, Hiroshi Takahashi3, Kunihiro Toge3, Yosuke Mizuno1 (1. YNU, 2. UTokyo, 3. NTT)

Keywords:

reflectometry,interferometry