Presentation Information
[B-4-15]Dielectric Constant Measurement of Sweet Potato with Hollow Cavity by Coaxial Probe Method
〇Takashi Kasuga1, Sora Tanaka1, Tomohiro Nakai1, Masahiro Tomioka1, Ayana Rikimaru1, Kazushi Asanuma1, Takahiro Kurosawa2, Hidetaka Watanabe3, Eiko Sugawara3, Keiichi Ito3 (1. National Institute of Technology, Nagano College, 2. Akita Industrial Technology Center, 3. National Institute of Technology, Akita College)
Keywords:
Coaxial Probe method,Dielectric Constant Measurement,Sweet Potato with Hollow Cavity,Debye dispersion