[N-1] Nonlinear Problems

3:30 PM - 3:45 PM JST(6:30 AM - 6:45 AM UTC)

[N-1-15] Mapping Technological Complexity through Corporate Patent Analysis

〇Rintaro Karashima¹, Hiroyasu Inoue^1,2 (1. University of Hyogo, Graduate School of Information Science, 2. Center for Computational Science, RIKEN)

Keywords:

Technological Complexity,Patents,Bipartite Network