Sep 2 - Sep 3, 1974The Tokyo Chamber of Commerce and Industry, Tokyo, Japan
[A3-4]Inherent Memory Effects in ZnS:Mn Thin-Film EL Devices
M. Takeda, Y. Kakihara, M. Yoshida, J. Kawaguchi, H. Kishishita, Y. Nakata Y. Yamauchi, T. Inoguchi, S. Mito(1.Central Research Lab., SHARP Corporation)