International Conference on Solid State Devices and Materials
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1975 Conference on Solid State Devices
Sep 1
- Sep 2, 1975
The Tokyo Chamber of Commerce and Industry, Tokyo, Japan
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1975 Conference on Solid State Devices
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1975 Conference on Solid State Devices
Sep 1
- Sep 2, 1975
The Tokyo Chamber of Commerce and Industry, Tokyo, Japan
[B-7-1]
X-Ray Topographic Study of Lattice Defects Related with Degradation of GaAs-Ga1-xAlxAs Double Heterostructure Lasers
S. Kishino, H. Nakashima, R. Ito, O. Nakada, M. Maki(1.Central Research Laboratory, Hitachi Ltd.)
https://doi.org/10.7567/SSDM.1975.B-7-1
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