1979 International Conference on Solid State Devices
Aug 27 - Aug 29, 1979The Tokyo Chamber of Commerce and Industry, Tokyo, Japan
1979 International Conference on Solid State Devices
Aug 27 - Aug 29, 1979The Tokyo Chamber of Commerce and Industry, Tokyo, Japan
[B-2-1]Interface Effects on Drain Current Instabilities in GaAs MESFETs with Buffer Layer
T. Itoh, H. Yanai(1.Department of Electronic Engineering, 2.University of Tokyo)
