International Conference on Solid State Devices and Materials
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1980 Conference on Solid State Devices
Aug 26
- Aug 27, 1980
The Tokyo Chamber of Commerce and Industry, Tokyo, Japan
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1980 Conference on Solid State Devices
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1980 Conference on Solid State Devices
Aug 26
- Aug 27, 1980
The Tokyo Chamber of Commerce and Industry, Tokyo, Japan
[A-4-5]
Soft Error Improvement in MOS RAM's by the use of Epitaxial Substrate
S. SATOH, M. DENDA, T. FUKUMOTO(1.LSI R&D Laboratory, Mitsubishi Electric Corporation)
https://doi.org/10.7567/SSDM.1980.A-4-5
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