1980 Conference on Solid State Devices

1980 Conference on Solid State Devices

Aug 26 - Aug 27, 1980The Tokyo Chamber of Commerce and Industry, Tokyo, Japan
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International Conference on Solid State Devices and Materials
1980 Conference on Solid State Devices

1980 Conference on Solid State Devices

Aug 26 - Aug 27, 1980The Tokyo Chamber of Commerce and Industry, Tokyo, Japan

[B-3-6]Effect of Long Term Stress on Hot Electron Trapping

H. MATSUMOTO, K. SAWADA, S. ASAI, M. HIRAYAMA, K. NAGASAWA(1.LSI R & D Laboratory, Mitsubishi Electric Corp.)
https://doi.org/10.7567/SSDM.1980.B-3-6
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