International Conference on Solid State Devices and Materials
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1983 Conference on Solid State Devices and Materials
Aug 30
- Sep 1, 1983
The Tokyo Chamber of Commerce and Industry, Tokyo, Japan
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1983 Conference on Solid State Devices and Materials
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1983 Conference on Solid State Devices and Materials
Aug 30
- Sep 1, 1983
The Tokyo Chamber of Commerce and Industry, Tokyo, Japan
[B-2-6]
Characterization of a New Gate Insulator BN on InP Grown by Low-Temperature CVD
Eiich Yamaguchi, Makoto Minakata(1.Musashino Electrical Comnunication Laboratory, NTT)
https://doi.org/10.7567/SSDM.1983.B-2-6
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