1983 Conference on Solid State Devices and Materials

1983 Conference on Solid State Devices and Materials

Aug 30 - Sep 1, 1983The Tokyo Chamber of Commerce and Industry, Tokyo, Japan
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International Conference on Solid State Devices and Materials
1983 Conference on Solid State Devices and Materials

1983 Conference on Solid State Devices and Materials

Aug 30 - Sep 1, 1983The Tokyo Chamber of Commerce and Industry, Tokyo, Japan

[B-3-8]Raman Scattering Measurement of the Free-Carrier Concentration in AlxGa1-xAs

T. Yuasa, S. Naritsuka, M. Mannoh, K. Shinozaki, K. Yamanaka, Y. Nomura, M. Mihara, M. Ishii(1.Optoelectronics Joint Research Laboratory)
https://doi.org/10.7567/SSDM.1983.B-3-8
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