1985 Conference on Solid State Devices and Materials
Aug 25 - Aug 27, 1985Nippon Toshi Center, Tokyo, Japan
1985 Conference on Solid State Devices and Materials
Aug 25 - Aug 27, 1985Nippon Toshi Center, Tokyo, Japan
[A-1-5]Comparison of α-Particle Induced Charge Collection on MOS Capacitors Using a DC Tester
Phil OLDIGES, Tohru FURUYAMA(1.Semiconductor Device Engineering Lab. Toshiba Corp., 2.Dept. of Elect. Engineering Cornell University)
