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1985 Conference on Solid State Devices and Materials
Aug 25
- Aug 27, 1985
Nippon Toshi Center, Tokyo, Japan
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1985 Conference on Solid State Devices and Materials
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1985 Conference on Solid State Devices and Materials
Aug 25
- Aug 27, 1985
Nippon Toshi Center, Tokyo, Japan
[A-1-7]
Current Leakage Analysis of Folded Capacitor Cell (FCC) for Future Megabit DRAMs
T. HAMAMOTO, N. SHIGYO, K. HIEDA, M. WADA(1.VLSI Research Center Toshiba Corporation)
https://doi.org/10.7567/SSDM.1985.A-1-7
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