1987 Conference on Solid State Devices and Materials

1987 Conference on Solid State Devices and Materials

Aug 25 - Aug 27, 1987Nippon Toshi Center, Tokyo, Japan
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International Conference on Solid State Devices and Materials
1987 Conference on Solid State Devices and Materials

1987 Conference on Solid State Devices and Materials

Aug 25 - Aug 27, 1987Nippon Toshi Center, Tokyo, Japan

[B-1-3]Analysis of Planar Channeling Effects on the Threshold Voltage Uniformity of GaAs MESFETs Using Stereographic Projection

Hitoshi MIKAMI, Naotaka UCHITOMI, Nobuyuki TOYODA(1.VLSI Research Center, Toshiba Corporation)
https://doi.org/10.7567/SSDM.1987.B-1-3
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