1988 International Conference on Solid State Devices and Materials
Aug 24 - Aug 26, 1988Keio Plaza Hotel, Tokyo, Japan
1988 International Conference on Solid State Devices and Materials
Aug 24 - Aug 26, 1988Keio Plaza Hotel, Tokyo, Japan
[B-1-5]New Phenomena in MNOS Retention Characteristics and Their Application to Memory Device Design for Megabit EEPROM's
Sin-ichi Minami, Yoshiaki Kamigaki, Ken Uchida, Koichi Nagasawa, Kazunori Furusawa, Takeshi Furuno, Takaaki Hagiwara, Masaaki Terasawa(1.Central Research Laboratory, Hitachi Ltd., 2.Musashi Works, Hitachi Ltd., 3.Hitachi VLSI Engineering Corp.)
