1991 International Conference on Solid State Devices and Materials
Aug 27 - Aug 29, 1991Pacifico Yokohama, Yokohama, Japan
1991 International Conference on Solid State Devices and Materials
Aug 27 - Aug 29, 1991Pacifico Yokohama, Yokohama, Japan
[A-1-2]PMOSFET Hot-Carrier Degradation Analyzed Over Ten Orders of Magnitude
R. Woltjer, A. Hamada, E. Takeda(1.Philips Research Laboratories, 2.Central Research Laboratory, Hitachi Ltd)
