1991 International Conference on Solid State Devices and Materials
Aug 27 - Aug 29, 1991Pacifico Yokohama, Yokohama, Japan
1991 International Conference on Solid State Devices and Materials
Aug 27 - Aug 29, 1991Pacifico Yokohama, Yokohama, Japan
[A-1-3]Spatial Distribution of Trapped Holes in the Oxide of MOSFETs after Uniform Hot-Hole Injection
QUAZI Deen Mohd Khosru, Naoki YASUDA, Akinori MARUYAMA, Kenji TANIGUCHI, Chihiro HAMAGUCHI(1.Department of Electronic Engineering, Osaka University)
