1991 International Conference on Solid State Devices and Materials
Aug 27 - Aug 29, 1991Pacifico Yokohama, Yokohama, Japan
1991 International Conference on Solid State Devices and Materials
Aug 27 - Aug 29, 1991Pacifico Yokohama, Yokohama, Japan
[C-2-5]Investigation of Breakdown Location in GaAs MESFETs by Two-Dimensional Simulation and Emission Microscopy
Jayne Ashworth, Norbert Arnold(1.SIEMENS AG, Corporate Research and Development)
