1992 International Conference on Solid State Devices and Materials
Aug 26 - Aug 28, 1992Tsukuba Center Building, Tsukuba, Japan
1992 International Conference on Solid State Devices and Materials
Aug 26 - Aug 28, 1992Tsukuba Center Building, Tsukuba, Japan
[PA1-8]Characterization of HF-Treated Si Surfaces by Photoluminescence Spectroscopy and Scanning Tunneling Microscopy
Tomohiro KONISHI, Katsuhiro UESUGI, Seiji KAWANO, Takafumi YAO, Hisayoshi OHSHIMA, Hiroyasu ITO, Tadashi HATTORI(1.Department of Electrical Engineering, Hiroshima University, 2.Research Laboratories Nippondenso Co., Ltd.)
