[S-I-4-2]First Application of STM Nano-Meter Size Oxidation Process to Planar-Type MIM Diode
KAZUHIKO MATSUMOTO, Shu Takahashi, Masami Ishii, Masakatsu Hoshi, Akira Kurokawa, Shingo Ichimura, Atsushi Ando(1.Electrotechnical Laboratory MITI, 2.Nissan Motor Co., LTD.)
