1995 International Conference on Solid State Devices and Materials
Aug 21 - Aug 24, 1995International House, Osaka, Japan
1995 International Conference on Solid State Devices and Materials
Aug 21 - Aug 24, 1995International House, Osaka, Japan
[B-1-4]Effects of Pixel Electrode Structure on Image Lag of STACK-CCD Image Sensor
Eiji OBA, Ryouhei MIYAGAWA, Hisanori IHARA, Michio SASAKI, Hirofumi YAMASHITA, Hiroyuki TANGO, Okio YOSHIDA, Sohei MANABE(1.ULSI Research Laboratories, Research and Development Center, Toshiba Corporation)
