1995 International Conference on Solid State Devices and Materials
Aug 21 - Aug 24, 1995International House, Osaka, Japan
1995 International Conference on Solid State Devices and Materials
Aug 21 - Aug 24, 1995International House, Osaka, Japan
[B-2-3]Comparison of Over Erase Susceptibility and Cycling Reliability between Channel Erase and Bitline Erase in Flash EEPROM
Jen-Tai Hsu, Stuart Shumway(1.Memory Product Division, National Semiconductor Corporation)
