1995 International Conference on Solid State Devices and Materials
Aug 21 - Aug 24, 1995International House, Osaka, Japan
1995 International Conference on Solid State Devices and Materials
Aug 21 - Aug 24, 1995International House, Osaka, Japan
[B-2-4]High-Reliability Programming Method Suitable for Flash Memories of More Than 256 Mb
Naoki Miyamoto, Takayuki Kawahara, Syun-ichi Saeki, Yusuke Jyouno, Masataka Kato, Katsutaka Kimura(1.Hitachi Device Engineering, Co., Ltd., 2.Central Research Laboratory, Hitachi Ltd., 3.Semiconductor & Integrated Circuits Division, Hitachi Ltd.)
