1995 International Conference on Solid State Devices and Materials
Aug 21 - Aug 24, 1995International House, Osaka, Japan
1995 International Conference on Solid State Devices and Materials
Aug 21 - Aug 24, 1995International House, Osaka, Japan
[D-1-2]Nanometer-Scale Current-Voltage Spectra Measurement of Resonant Tunneling Diodes Using Scanning Force Microscopy
Masafumi TANIMOTO, Kiyoshi KANISAWA, Masanori SHINOHARA(1.NTT LSI Laboratories, 2.NTT Basic Research Laboratories)
