1995 International Conference on Solid State Devices and Materials
Aug 21 - Aug 24, 1995International House, Osaka, Japan
1995 International Conference on Solid State Devices and Materials
Aug 21 - Aug 24, 1995International House, Osaka, Japan
[S-I-1-4]Interface States at Ultrathin Chemical Oxide/Silicon Interfaces Obtained from Measurements of XPS Spectra under Biases
Hikaru Kobayashi, Yoshiyuki Yamashita, Kenji Namba, Yoshihiro Nakato, Yasushiro Nishioka(1.Department of Chemistry, Faculty of Engineering Science, and Research Center for Photoenergetics of Organic Materials, Osaka University, 2.Tsukuba Research and Development Center, Texas Instruments Japan)
