1997 International Conference on Solid State Devices and Materials

1997 International Conference on Solid State Devices and Materials

Sep 16 - Sep 19, 1997ACT CITY Hamamatsu, Hamamatsu, Japan
International Conference on Solid State Devices and Materials
1997 International Conference on Solid State Devices and Materials

1997 International Conference on Solid State Devices and Materials

Sep 16 - Sep 19, 1997ACT CITY Hamamatsu, Hamamatsu, Japan

[A-1-1]Reliability and Scaling of Thin Gate Oxide

Chenming Hu(1.Dept. of Electrical Engineering & Computer Sciences, University of California)
https://doi.org/10.7567/SSDM.1997.A-1-1