1997 International Conference on Solid State Devices and Materials

1997 International Conference on Solid State Devices and Materials

Sep 16 - Sep 19, 1997ACT CITY Hamamatsu, Hamamatsu, Japan
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International Conference on Solid State Devices and Materials
1997 International Conference on Solid State Devices and Materials

1997 International Conference on Solid State Devices and Materials

Sep 16 - Sep 19, 1997ACT CITY Hamamatsu, Hamamatsu, Japan

[A-3-2]Gate Voltage Dependence of Reliability for Ultra-Thin Oxides

Tanya Nigam, Michel Depas, Robin Degraeve, Marc M. Heyns, Guido Groeseneken(1.IMEC)
https://doi.org/10.7567/SSDM.1997.A-3-2
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