1997 International Conference on Solid State Devices and Materials

1997 International Conference on Solid State Devices and Materials

Sep 16 - Sep 19, 1997ACT CITY Hamamatsu, Hamamatsu, Japan
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International Conference on Solid State Devices and Materials
1997 International Conference on Solid State Devices and Materials

1997 International Conference on Solid State Devices and Materials

Sep 16 - Sep 19, 1997ACT CITY Hamamatsu, Hamamatsu, Japan

[A-3-3]An Experimental Evidence to Link the Origins of "A Mode" and "B Mode" Stress Induced Leakage Current

Kenji Okada(1.ULSI Process Technology Development Center, Matsushita Electronics Corporation)
https://doi.org/10.7567/SSDM.1997.A-3-3
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