1999 International Conference on Solid State Devices and Materials
Sep 21 - Sep 24, 1999Nihon Toshi Center Kaikan, Tokyo, Japan
1999 International Conference on Solid State Devices and Materials
Sep 21 - Sep 24, 1999Nihon Toshi Center Kaikan, Tokyo, Japan
[A-2-4]Simulation of Temperature Dependence of Microwave Noise in MOS Transistors
Michael Obrecht, Tajinder Manku(1.RF Technology Group, Electrical and Computer Engineering Department, University of Waterloo)
