1999 International Conference on Solid State Devices and Materials
Sep 21 - Sep 24, 1999Nihon Toshi Center Kaikan, Tokyo, Japan
1999 International Conference on Solid State Devices and Materials
Sep 21 - Sep 24, 1999Nihon Toshi Center Kaikan, Tokyo, Japan
[B-1-2]Dependence of Sub-Threshold Hump and RNWE Characteristics on the Gate Length by TED
Jong-Wan Jung, Jong-Min Kim, Jeong-Hwan Son, Shin-Young Chung, Young-Jong Lee, Hyun-Cheol Kim, Kyung-Ho Lee(1.LG Semicon Co., Ltd.)
