1999 International Conference on Solid State Devices and Materials
Sep 21 - Sep 24, 1999Nihon Toshi Center Kaikan, Tokyo, Japan
1999 International Conference on Solid State Devices and Materials
Sep 21 - Sep 24, 1999Nihon Toshi Center Kaikan, Tokyo, Japan
[D-2-3]Charging States of Si Quantum Dots as Detected by AFM/Kelvin Probe Technique
Naoji Shimizu, Mitsuhisa Ikeda, Eiji Yoshida, Seiichi Miyazaki, Masataka Hirose(1.Department of Electrical Engineering, Hiroshima University)
