[A-2-3]Ultra-Thin Silicon Oxynitride Films as Cu Diffusion Barrier for Lowering Interconnect Resistivity
Tetsuhiro Nanbu, Katsuyuki Sekine, Yuji Saito, Shin-ichi Nakao, Masaki Hirayama, Tadahiro Ohmi(1.Department of Electronic Engineering, Graduate School of Engineering, Tohoku University, 2.New Industry Creation Hatchery Center, Tohoku University)
