2004 International Conference on Solid State Devices and Materials
Sep 14 - Sep 17, 2004Tower Hall Funabori, Tokyo, Japan
2004 International Conference on Solid State Devices and Materials
Sep 14 - Sep 17, 2004Tower Hall Funabori, Tokyo, Japan
[A-2-4]Temperature effects of constant bias stress on NFETs with Hf-based gate dielectric
Rino Choi, Byoung Hun Lee, Chadwin D. Young, Jang Hoan Sim, Gennadi Bersuker(1.International SEMATECH, 2.IBM assignee)
