2004 International Conference on Solid State Devices and Materials
Sep 14 - Sep 17, 2004Tower Hall Funabori, Tokyo, Japan
2004 International Conference on Solid State Devices and Materials
Sep 14 - Sep 17, 2004Tower Hall Funabori, Tokyo, Japan
[A-7-4L]Effect of Strain on Static and Dynamic NBTI of pMOSFETs
Hong-Nien Lin, Horng-Chih Lin, Tiao-Yuan Huang, Chih-Hsin Ko, Chung-Hu Ge, C.-C. Lin, Chien-Chao Huang(1.Institute of Electronics, National Chiao-Tung University, 2.National Nano Device Laboratories, 3.Taiwan Semiconductor Manufacturing Company, Ltd.)
