2004 International Conference on Solid State Devices and Materials
Sep 14 - Sep 17, 2004Tower Hall Funabori, Tokyo, Japan
2004 International Conference on Solid State Devices and Materials
Sep 14 - Sep 17, 2004Tower Hall Funabori, Tokyo, Japan
[B-1-1]Electrical Characterization of High-k Gated MOSFETs and Interfaces
T.P. Ma(1.Yale University Center for Microelectronic Materials and Structures, and Department of Electrical Engineering)
