2005 International Conference on Solid State Devices and Materials
Sep 12 - Sep 15, 2005International Conference Center Kobe, Kobe, Japan
2005 International Conference on Solid State Devices and Materials
Sep 12 - Sep 15, 2005International Conference Center Kobe, Kobe, Japan
[A-4-2]A novel inversion pulse measurement technique to investigate transient charging characteristics in high-k NMOS transistors
Rino Choi, B. H. Lee, H. K. Park, C.D. Young, J.H. Sim, S.C. Song, G. Bersuker(1.SEMATECH, 2.IBM assignee, 3.Gwanju Institute of Science and Technology)
